ENGINEERING EVIDENCE
A result needs
its conditions.
The figures below come from the supplied LTspice circuit-model test logs. They do not establish physical sensor distance, accuracy or fab performance.
Source: supplied LTspice log summaries. Test files: EFS1M_FAST_EDGE.cir / EFS1M_NOISE_SWEEP.cir. Public source files and a circuit revision identifier are not yet attached.
Output noise by input capacitance
LTspice · 27 °CIntegrated output noise · 0.1 Hz–1 kHz · µV RMS
All bars use the same 0–40 µV scale. Integrated output noise increases at higher input capacitance. ADC, power, wiring and physical sensor effects must still be assessed.
| External capacitance | Transient plateau change | Integrated noise |
|---|---|---|
| 20 pF | −1.043010 mV | 19.38 µV RMS |
| 100 pF | −1.043011 mV | 20.12 µV RMS |
| 500 pF | −1.043013 mV | 32.03 µV RMS |
Transient: 9–10 ms average relative to baseline. Noise: 0.1 Hz–1 kHz integration in a separate noise analysis. These results alone do not establish system SNR.
Preparing for field reporting.
No field-pilot data is available yet. Instead of simulated customer results, these are the reporting fields to agree on for a pilot.
| Record | Purpose |
|---|---|
| Device ID · time · conditions | Trace data origin and test conditions |
| Position or zone identifier | Compare recurring zones — location integration needs validation |
| Raw readings · calibration | Trace processing and reference comparisons |
| Missing data · health | Identify records unsuitable for analysis |