01
Device damage
Discharge can damage oxides or junctions and lead to functional failure.
NOVA / WHY ELECTROSTATICS
Invisible static.
A visible impact on quality.
A discharge can damage devices. Accumulated charge can attract contamination. NOVA is developing technology to record electric-field changes in industrial environments.
02
Particle attraction
Charged surfaces can attract particles, contributing to wafer defects and yield loss.
03
System upset
Discharge can disrupt electronic operation, making conditions and event history important.
AI-generated concepts · Not failure-analysis or customer photographs.
What is the difference between static charge and discharge?
Static electricity is an imbalance of charge and can arise from contact and separation. ESD is a rapid transfer of charge. A field reading alone does not establish a discharge event or the cause of a defect.
Technical reference: EOS/ESD Association · Fundamentals, Part 1 ↗
OUR PRODUCT / EOS
Where conditions change,
measurement follows.
EOS is an electrostatic monitoring system in development, combining a module for mobile equipment with data software.
In development · Integration, calibration and field validation ahead
Discover the productEOS / RECORDS THAT MATTER
Records for the workplace.
Changes in readings
Review measurement history by time and device ID.
Record quality
Designed to review device health and missing intervals together.
Recurring routes
The goal is to compare recurring changes after validating location and zone integration.
These are intended record-review capabilities. Device integration and field suitability remain to be validated.
APPLICATIONS
The route of a cart.
The start of a record.
Our initial focus is material carts and transfer routes in semiconductor fabs. Scope depends on installation, grounding and communication conditions.Pilot collaboration
EVIDENCE / DEVELOPMENT
Evidence, with
the conditions that matter.
Circuit-model testing
Transient, frequency-response and noise analyses are available, separately identified from physical sensor performance.
Integration and calibration
Physical sensor integration, reference comparisons and repeatability testing remain. No field defect-reduction results are available yet.
ABOUT NOVA
Technology to understand
industrial change.
NOVA develops measurement hardware and data software together. We start with a clear question from the workplace and build evidence step by step.
About NOVA